Nanoscale deformation in polymers revealed by single-molecule super-resolution localization-orientation microscopy

Muzhou Wang*, James M. Marr, Marcelo Davanco, Jeffrey W. Gilman, J. Alexander Liddle

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Mechanical failure occurs through a hierarchical process, making it necessary to understand deformation at all length scales in order to develop advanced materials with, for example, enhanced toughness. This study addresses this challenge by demonstrating an optical imaging technique that detects damage at the nanoscale. We use single-molecule fluorescence microscopy experiments to simultaneously determine the position and orientation of single fluorophores from in-focus widefield images by fitting orientation-dependent point-spread functions determined by vectorial diffraction calculations. This capability is combined with switchable fluorophores in a single-molecule super-resolution microscopy scheme, enabling reconstruction of fluorophore orientation and alignment information at the nanoscale. We apply this method to polymer films deformed by thermal nanoimprint lithography, using fluorophore orientation mapping to detect areas of deformed material as small as 20 nm and distinguish them from neighboring, unperturbed regions. This technique advances the application of super-resolution microscopy in materials science, and may be applied to further the study of nanomechanical phenomena.

Original languageEnglish (US)
Pages (from-to)817-825
Number of pages9
JournalMaterials Horizons
Volume6
Issue number4
DOIs
StatePublished - May 2019

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Process Chemistry and Technology
  • Electrical and Electronic Engineering

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