Abstract
Third-harmonic generation (THG) near-field scanning optical microscopy (NSOM) was used to investigate both as-cast and thermally annealed films of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV). Many small domains with increased ground-state π-electron delocalization were observed in the thermally annealed films. The results indicate that the ground-state electronic properties of conjugated polymer films become highly inhomogeneous upon annealing.
Original language | English (US) |
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Pages (from-to) | 6688-6698 |
Number of pages | 11 |
Journal | Journal of Chemical Physics |
Volume | 117 |
Issue number | 14 |
DOIs | |
State | Published - Oct 8 2002 |
ASJC Scopus subject areas
- General Physics and Astronomy
- Physical and Theoretical Chemistry