Near-field microscopy of photonic devices

Bennett B. Goldberg*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Near-field Scanning Optical Microscopy has been used to measure internal optical modes in photonic devices. By combining the standing mode period, transverse mode shape and decay constants, the values of all spatial components of the wavevector are determined.

Original languageEnglish (US)
Pages (from-to)426-427
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
StatePublished - Dec 1 2000

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering

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