Abstract
Near-field Scanning Optical Microscopy has been used to measure internal optical modes in photonic devices. By combining the standing mode period, transverse mode shape and decay constants, the values of all spatial components of the wavevector are determined.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 426-427 |
| Number of pages | 2 |
| Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Volume | 2 |
| State | Published - Dec 1 2000 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering