Near-field scanning optical microscopic studies of micro-ring resonators

Gregory H. Vander Rhodes*, Bennett B. Goldberg, M. Selim Unlu, Sai Tak Chu, Brent E. Little

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Near-field scanning optical microscopy (NSOM) can be used to measure internal optical intensity within both basic and novel guided-wave structures. This method has a number of advantages over other methods, including the ability to distinguish scattered from guided light and determine the vectorial components of the wavevector, all with a minimum amount of perturbation.

Original languageEnglish (US)
Pages (from-to)552-553
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
StatePublished - Dec 1 1999
EventProceedings of the 1999 12th Annual Meeting IEEE Lasers and Electro-Optics Society (LEOS'99) - San Francisco, CA, USA
Duration: Nov 8 1999Nov 11 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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