Near-field scanning optical microscopic studies of micro-ring resonators

Gregory H. Vander Rhodes; Bennett B. Goldberg; M. Selim Unlu; Sai Tak Chu; Brent E. Little

Near-field scanning optical microscopic studies of micro-ring resonators

Gregory H. Vander Rhodes^*, Bennett B. Goldberg, M. Selim Unlu, Sai Tak Chu, Brent E. Little

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

Abstract

Near-field scanning optical microscopy (NSOM) can be used to measure internal optical intensity within both basic and novel guided-wave structures. This method has a number of advantages over other methods, including the ability to distinguish scattered from guided light and determine the vectorial components of the wavevector, all with a minimum amount of perturbation.

Original language	English (US)
Pages (from-to)	552-553
Number of pages	2
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2
State	Published - Dec 1 1999
Event	Proceedings of the 1999 12th Annual Meeting IEEE Lasers and Electro-Optics Society (LEOS'99) - San Francisco, CA, USA Duration: Nov 8 1999 → Nov 11 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

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title = "Near-field scanning optical microscopic studies of micro-ring resonators",

abstract = "Near-field scanning optical microscopy (NSOM) can be used to measure internal optical intensity within both basic and novel guided-wave structures. This method has a number of advantages over other methods, including the ability to distinguish scattered from guided light and determine the vectorial components of the wavevector, all with a minimum amount of perturbation.",

author = "{Vander Rhodes}, {Gregory H.} and Goldberg, {Bennett B.} and Unlu, {M. Selim} and Chu, {Sai Tak} and Little, {Brent E.}",

year = "1999",

month = dec,

day = "1",

language = "English (US)",

volume = "2",

pages = "552--553",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

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note = "Proceedings of the 1999 12th Annual Meeting IEEE Lasers and Electro-Optics Society (LEOS'99) ; Conference date: 08-11-1999 Through 11-11-1999",

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T1 - Near-field scanning optical microscopic studies of micro-ring resonators

AU - Vander Rhodes, Gregory H.

AU - Goldberg, Bennett B.

AU - Unlu, M. Selim

AU - Chu, Sai Tak

AU - Little, Brent E.

PY - 1999/12/1

Y1 - 1999/12/1

N2 - Near-field scanning optical microscopy (NSOM) can be used to measure internal optical intensity within both basic and novel guided-wave structures. This method has a number of advantages over other methods, including the ability to distinguish scattered from guided light and determine the vectorial components of the wavevector, all with a minimum amount of perturbation.

AB - Near-field scanning optical microscopy (NSOM) can be used to measure internal optical intensity within both basic and novel guided-wave structures. This method has a number of advantages over other methods, including the ability to distinguish scattered from guided light and determine the vectorial components of the wavevector, all with a minimum amount of perturbation.

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M3 - Conference article

AN - SCOPUS:0033337726

SN - 1092-8081

VL - 2

SP - 552

EP - 553

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

T2 - Proceedings of the 1999 12th Annual Meeting IEEE Lasers and Electro-Optics Society (LEOS'99)

Y2 - 8 November 1999 through 11 November 1999

ER -

Near-field scanning optical microscopic studies of micro-ring resonators

Abstract

ASJC Scopus subject areas

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