Near-field ultrasonic imaging: A novel method for nondestructive mechanical imaging of IC interconnect structures

G. S. Shekhawat, H. Xie, Y. Zheng, R. E. Geer

Research output: Contribution to journalArticlepeer-review

Abstract

Tne investigation of an alternate approach to nondestructive, nanoscale mechanical imaging for IC interconnect structures is reported. This approach utilizes a heterodyne interferometer based on a scanning probe microscope, also referred to as heterodyne force microscopy (HFM). This interferometer is sensitive to the relative phase difference of the two ultrasonic excitations due to spatial variations in the sample viscoelastic response and enables near-field, phase-sensitive imaging. Proof-of-feasibility demonstrations of this technique are presented for ultrasonic phase-imaging of Al/low-k interconnect structures. Spatial resolution < 10 nm is demonstrated.

Original languageEnglish (US)
Pages (from-to)519-524
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume716
DOIs
StatePublished - 2002

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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