Neutral-current electroweak physics and SMEFT studies at the EIC

Radja Boughezal, Alexander Emmert, Tyler Kutz, Sonny Mantry, Michael Nycz, Frank Petriello, Kaǧan Şimşek, Daniel Wiegand, Xiaochao Zheng

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We study the potential for precision electroweak (EW) measurements and beyond-the-Standard Model (BSM) searches using cross-section asymmetries in neutral-current deep inelastic scattering at the electron-ion collider (EIC). Our analysis uses a complete and realistic accounting of systematic errors from both theory and experiment and considers the potential of both proton and deuteron beams for a wide range of energies and luminosities. We also consider what can be learned from a possible future positron beam and a potential tenfold luminosity upgrade of the EIC beyond its initial decade of running. We use the SM effective field theory (SMEFT) framework to parametrize BSM effects and focus on semileptonic four-fermion operators, whereas for our precision EW study, we determine how well the EIC can measure the weak mixing angle. New features of our study include the use of an up-to-date detector design of the EIC Comprehensive Chromodynamics Experiment and accurate running conditions of the EIC, the simultaneous fitting of beam polarization uncertainties and Wilson coefficients to improve the sensitivity to SMEFT operators, and the inclusion of the weak mixing angle running in our fit template. We find that the EIC can probe BSM operators at scales competitive with and in many cases exceeding LHC Drell-Yan bounds while simultaneously not suffering from degeneracies between Wilson coefficients.

Original languageEnglish (US)
Article number016006
JournalPhysical Review D
Volume106
Issue number1
DOIs
StatePublished - Jul 1 2022

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Fingerprint

Dive into the research topics of 'Neutral-current electroweak physics and SMEFT studies at the EIC'. Together they form a unique fingerprint.

Cite this