New Applications in Atom Probe Tomography

D. J. Larson, D. A. Reinhard, T. J. Prosa, D. Olson, D. Lawrence, P. H. Clifton, R. M. Ulfig, I. Martin, T. F. Kelly, V. S. Smentkowski, L. M. Gordon, D. Joester, K. Inoue

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1608-1609
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - 2012

Cite this

Larson, D. J., Reinhard, D. A., Prosa, T. J., Olson, D., Lawrence, D., Clifton, P. H., Ulfig, R. M., Martin, I., Kelly, T. F., Smentkowski, V. S., Gordon, L. M., Joester, D., & Inoue, K. (2012). New Applications in Atom Probe Tomography. Microscopy and Microanalysis, 18, 1608-1609. https://doi.org/10.1017/S1431927612006484