New directions in X-ray microscopy

Roger Falcone*, Chris Jacobsen, Janos Kirz, Stefano Marchesini, David Shapiro, John Spence

*Corresponding author for this work

Research output: Contribution to journalArticle

58 Scopus citations

Abstract

The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

Original languageEnglish (US)
Pages (from-to)293-318
Number of pages26
JournalContemporary Physics
Volume52
Issue number4
DOIs
StatePublished - Jul 1 2011

Keywords

  • Phase-contrast
  • X-ray diffraction
  • X-ray microscopy
  • X-ray optics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Falcone, R., Jacobsen, C., Kirz, J., Marchesini, S., Shapiro, D., & Spence, J. (2011). New directions in X-ray microscopy. Contemporary Physics, 52(4), 293-318. https://doi.org/10.1080/00107514.2011.589662