The application is described of various bright field and dark field imaging methods to the study of catalyst and other small particles in the presence of scattering effects from the support. A major advance has been possible with the use of annular dark field, Z contrast and microdiffraction techniques in the STEM. Microanalysis of individual particles can now be carried out almost routinely. Methods of imaging surface structure are under development and it may also be possible to extract useful information about valence electron properties.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics