Abstract
The application is described of various bright field and dark field imaging methods to the study of catalyst and other small particles in the presence of scattering effects from the support. A major advance has been possible with the use of annular dark field, Z contrast and microdiffraction techniques in the STEM. Microanalysis of individual particles can now be carried out almost routinely. Methods of imaging surface structure are under development and it may also be possible to extract useful information about valence electron properties.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 163-174 |
| Number of pages | 12 |
| Journal | Ultramicroscopy |
| Volume | 8 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 1982 |
Funding
We are grateful to Drs. D. J. Smith and M. M. J. Treacy for supplying pictures. The Science Research Council has financed some of this work in conjunction with I.C.I. Ltd. as wel] as providing support for L.D.M. and S..].P,
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation