New measurements of the elastic properties of composition modulated Cu-Ni thin films

A. Moreau*, J. B. Ketterson, J. Mattson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Using a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (Sz) modulus (allowing the calculation of the biaxial and Young's moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17-40 Å.

Original languageEnglish (US)
Pages (from-to)1959-1961
Number of pages3
JournalApplied Physics Letters
Volume56
Issue number20
DOIs
StatePublished - Dec 1 1990

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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