New measurements of the elastic properties of composition modulated Cu-Ni thin films

A. Moreau; J. B. Ketterson; J. Mattson

doi:10.1063/1.103034

New measurements of the elastic properties of composition modulated Cu-Ni thin films

A. Moreau^*, J. B. Ketterson, J. Mattson

^*Corresponding author for this work

MRC - Materials Research Center

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

Using a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (S_z) modulus (allowing the calculation of the biaxial and Young's moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17-40 Å.

Original language	English (US)
Pages (from-to)	1959-1961
Number of pages	3
Journal	Applied Physics Letters
Volume	56
Issue number	20
DOIs	https://doi.org/10.1063/1.103034
State	Published - 1990

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.103034

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abstract = "Using a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (Sz) modulus (allowing the calculation of the biaxial and Young's moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17-40 {\AA}.",

author = "A. Moreau and Ketterson, {J. B.} and J. Mattson",

year = "1990",

doi = "10.1063/1.103034",

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T1 - New measurements of the elastic properties of composition modulated Cu-Ni thin films

AU - Moreau, A.

AU - Ketterson, J. B.

AU - Mattson, J.

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N2 - Using a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (Sz) modulus (allowing the calculation of the biaxial and Young's moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17-40 Å.

AB - Using a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (Sz) modulus (allowing the calculation of the biaxial and Young's moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17-40 Å.

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DO - 10.1063/1.103034

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

ER -

New measurements of the elastic properties of composition modulated Cu-Ni thin films

Abstract

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