New methods of imaging surfaces (and buried interfaces)

L. D. Marks, E. Bengu, C. J. Gilmore*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Recent develpments have shown it is possible to obatain information at the atomic level from surfaces, in some cases to one Angstrom or better resolution. This paper reviews these developments, discusses their current limitations, and points out that they can be used as readily for buried interfaces.

Original languageEnglish (US)
Pages (from-to)207-214
Number of pages8
JournalJournal of Electron Microscopy
Volume46
Issue number3
DOIs
StatePublished - 1997

Funding

A,-.1,-,-. ,i.jn__ . Acknowledgements We would like to acknowledge significant collaborations with Sumio Bjlma and Doug Dorset. This work would not have been possible without R. Plass, C. CoUazo-Davilla, E. Landree and D. Grozea. This study was supported by the National Sdence Foundation on grant number DMR-9529453

Keywords

  • Atomic level
  • Structure
  • Surfaces

ASJC Scopus subject areas

  • Instrumentation

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