New methods of imaging surfaces (and buried interfaces)

Laurence Marks, E. Bengu, C. J. Gilmore*

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Recent develpments have shown it is possible to obatain information at the atomic level from surfaces, in some cases to one Angstrom or better resolution. This paper reviews these developments, discusses their current limitations, and points out that they can be used as readily for buried interfaces.

Original languageEnglish (US)
Pages (from-to)207-214
Number of pages8
JournalJournal of Electron Microscopy
Volume46
Issue number3
DOIs
StatePublished - Jan 1 1997

Keywords

  • Atomic level
  • Structure
  • Surfaces

ASJC Scopus subject areas

  • Instrumentation

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