Abstract
Recent develpments have shown it is possible to obatain information at the atomic level from surfaces, in some cases to one Angstrom or better resolution. This paper reviews these developments, discusses their current limitations, and points out that they can be used as readily for buried interfaces.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 207-214 |
| Number of pages | 8 |
| Journal | Journal of Electron Microscopy |
| Volume | 46 |
| Issue number | 3 |
| DOIs | |
| State | Published - Jan 1 1997 |
Keywords
- Atomic level
- Structure
- Surfaces
ASJC Scopus subject areas
- Instrumentation
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Cite this
Marks, L., Bengu, E., & Gilmore, C. J. (1997). New methods of imaging surfaces (and buried interfaces). Journal of Electron Microscopy, 46(3), 207-214. https://doi.org/10.1093/oxfordjournals.jmicro.a023510