New trends in X-ray standing waves

Michael J. Bedzyk*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

A review of three new methods for generating X-ray standing waves is given, namely Bragg diffraction from layered synthetic microstructures, specular reflection from mirror surfaces, and Bragg diffraction in the backscattering geometry. Unlike conventional X-ray standing wave measurements which use dynamical Bragg diffraction from perfect single crystals (such as silicon and germanium), these new methods provide angular reflection widths measured in milliradians instead of microradians and are therefore applicable to a more general class of solid substrates. Emphasis will be given to the application of these new methods for the study of surface and interface structures.

Original languageEnglish (US)
Pages (from-to)679-683
Number of pages5
JournalNuclear Inst. and Methods in Physics Research, A
Volume266
Issue number1-3
DOIs
StatePublished - Apr 1 1988

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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