New trends in X-ray standing waves

Michael J. Bedzyk

doi:10.1016/0168-9002(88)90464-0

New trends in X-ray standing waves

Michael J. Bedzyk^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Abstract

A review of three new methods for generating X-ray standing waves is given, namely Bragg diffraction from layered synthetic microstructures, specular reflection from mirror surfaces, and Bragg diffraction in the backscattering geometry. Unlike conventional X-ray standing wave measurements which use dynamical Bragg diffraction from perfect single crystals (such as silicon and germanium), these new methods provide angular reflection widths measured in milliradians instead of microradians and are therefore applicable to a more general class of solid substrates. Emphasis will be given to the application of these new methods for the study of surface and interface structures.

Original language	English (US)
Pages (from-to)	679-683
Number of pages	5
Journal	Nuclear Inst. and Methods in Physics Research, A
Volume	266
Issue number	1-3
DOIs	https://doi.org/10.1016/0168-9002(88)90464-0
State	Published - Apr 1 1988

Funding

I would hke to acknowledge the computational help given by M. Bommarito and M. McMillan. This work was supported by the National Science Foundation (DMR-84-12465).

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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10.1016/0168-9002(88)90464-0

Cite this

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title = "New trends in X-ray standing waves",

abstract = "A review of three new methods for generating X-ray standing waves is given, namely Bragg diffraction from layered synthetic microstructures, specular reflection from mirror surfaces, and Bragg diffraction in the backscattering geometry. Unlike conventional X-ray standing wave measurements which use dynamical Bragg diffraction from perfect single crystals (such as silicon and germanium), these new methods provide angular reflection widths measured in milliradians instead of microradians and are therefore applicable to a more general class of solid substrates. Emphasis will be given to the application of these new methods for the study of surface and interface structures.",

author = "Bedzyk, {Michael J.}",

note = "Funding Information: I would hke to acknowledge the computational help given by M. Bommarito and M. McMillan. This work was supported by the National Science Foundation (DMR-84-12465).",

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N2 - A review of three new methods for generating X-ray standing waves is given, namely Bragg diffraction from layered synthetic microstructures, specular reflection from mirror surfaces, and Bragg diffraction in the backscattering geometry. Unlike conventional X-ray standing wave measurements which use dynamical Bragg diffraction from perfect single crystals (such as silicon and germanium), these new methods provide angular reflection widths measured in milliradians instead of microradians and are therefore applicable to a more general class of solid substrates. Emphasis will be given to the application of these new methods for the study of surface and interface structures.

AB - A review of three new methods for generating X-ray standing waves is given, namely Bragg diffraction from layered synthetic microstructures, specular reflection from mirror surfaces, and Bragg diffraction in the backscattering geometry. Unlike conventional X-ray standing wave measurements which use dynamical Bragg diffraction from perfect single crystals (such as silicon and germanium), these new methods provide angular reflection widths measured in milliradians instead of microradians and are therefore applicable to a more general class of solid substrates. Emphasis will be given to the application of these new methods for the study of surface and interface structures.

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ER -

New trends in X-ray standing waves

Abstract

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