Non-negative matrix analysis in X-ray spectromicroscopy: Choosing regularizers

Rachel Mak, Stefan M. Wild, Chris Jacobsen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


In X-ray spectromicroscopy, a set of images can be acquired across an absorption edge to reveal chemical speciation. We previously described the use of non-negative matrix approximation methods for improved classification and analysis of these types of data. We present here an approach to find appropriate values of regularization parameters for this optimization approach.

Original languageEnglish (US)
Title of host publicationXRM 2014
Subtitle of host publicationProceedings of the 12th International Conference on X-Ray Microscopy
EditorsMartin D. de Jonge, David J. Paterson, Christopher G. Ryan
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735413436
StatePublished - Jan 28 2016
Event12th International Conference on X-Ray Microscopy, XRM 2014 - Melbourne, Australia
Duration: Oct 26 2014Oct 31 2014

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Other12th International Conference on X-Ray Microscopy, XRM 2014


  • X-ray microscopy
  • X-ray spectromicroscopy
  • multivariate statistical analysis
  • non-negative matrix analysis
  • optimization

ASJC Scopus subject areas

  • General Physics and Astronomy


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