Noncontact optical determination of thin film mechanical, thermal, and adhesion properties

John A. Rogers*, Lisa Dhar, Yongwu Yang, Keith A. Nelson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

An optical method for characterization of polymer and other thin film is described. The method permits noninvasive determination of anisotropic elastic moduli and thermal diffusivities and assessment of whether a film is adhered to or delaminated from a substrate. Optically generated acoustic waves and thermal responses are monitored in real time to provide the information. Possibilities for characterization of adhesion quality and for miniaturization of the measurement apparatus are discussed.

Original languageEnglish (US)
Title of host publicationAnnual Technical Conference - ANTEC, Conference Proceedings
PublisherSoc of Plastics Engineers
Pages2812-2815
Number of pages4
Volume2
StatePublished - Jan 1 1995
EventProceedings of the 53rd Annual Technical Conference. Part 1 (of 3) - Boston, MA, USA
Duration: May 7 1995Oct 11 1995

Other

OtherProceedings of the 53rd Annual Technical Conference. Part 1 (of 3)
CityBoston, MA, USA
Period5/7/9510/11/95

ASJC Scopus subject areas

  • Engineering(all)

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