Nondestructive determination of the depth of different texture components in polycrystalline samples

The surface and the center average textures (macrotexture) of plates of many alloys differ substantially, and nondestructive methods for determining the depth of different texture components would be very useful in various applications. This report evaluates one method based on recording microbeam transmission Laue patterns as a function of sample-detector separation and on tracing the diffracted rays back to their physical origin. Polychromatic synchrotron x-radiation and absorption edge filters are used. Results from sections of Al-Li 2090 T8E41 plates are reported, and limitations of the ray tracing technique are discussed.