Nondestructive testing of adhesively bonded structures using synchronized pressure stressing

Thomas C. Chatters*, Bruno F. Pouet, Sridhar Krishnaswamy

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Electronic speckle pattern interferometry (ESPI) utilizing a phase-modulation of the object beam and a continuous reference-updating technique is proposed to provide noise reduction in optical NDE methods. Unlike conventional ESPI techniques, this method uses phase modulation between successively subtracted additive speckle interference images. The ability of this technique to work in a turbulent environment is demonstrated, and application to detection of structural defects in adhesively bonded structures, a problem of interest to the NDE community, is shown.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMichael T. Valley, Nancy K. Del Grande, Albert S. Kobayashi
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages236-247
Number of pages12
Volume2001
ISBN (Print)0819412503
StatePublished - Dec 1 1993
EventNondestructive Inspection of Aging Aircraft - San Diego, CA, USA
Duration: Jul 14 1993Jul 15 1993

Other

OtherNondestructive Inspection of Aging Aircraft
CitySan Diego, CA, USA
Period7/14/937/15/93

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Chatters, T. C., Pouet, B. F., & Krishnaswamy, S. (1993). Nondestructive testing of adhesively bonded structures using synchronized pressure stressing. In M. T. Valley, N. K. Del Grande, & A. S. Kobayashi (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2001, pp. 236-247). Publ by Society of Photo-Optical Instrumentation Engineers.