Normal-state resistance fluctuations in high-Tc cuprate films

Li Liu*, K. Zhang, H. M. Jaeger, D. B. Buchholz, R P H Chang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

We have measured 1/f resistance fluctuations at room temperature in YBa2Cu3Ox films as a function of oxygen content, x. The films were single phase, c-axis oriented and grown by pulsed organometallic-beam epitaxy on LaAlO3 substrates. In contrast to the monotonic increase of the film resistance with decreasing x, the normalized noise power was found to exhibit a sharp minimum at x=6.5. We attribute this behavior to vacancy creation in the Cu-O chains and discuss a simple model based on parallel conduction paths through both chains and planes.

Original languageEnglish (US)
Pages (from-to)3679-3682
Number of pages4
JournalPhysical Review B
Volume49
Issue number5
DOIs
StatePublished - Jan 1 1994

ASJC Scopus subject areas

  • Condensed Matter Physics

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