Novel in situ cleavage technique for cross-sectional scanning tunneling microscopy sample preparation

Y. C. Kim*, M. J. Nowakowski, David N Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A novel in situ sample cleavage technique has been developed for fabricating specimens for cross-sectional scanning tunneling microscopy applications. This technique can be easily adapted to any ultrahigh vacuum scanning tunneling microscope that has coarse motion and tip exchange capabilities. A 90° bent diamond tip attached to a tip holder is used to make micron long scratches on GaAs(001) surfaces along a 〈110〉 direction. The sample is then fractured and the cross-sectional surface is scanned in the conventional way. Atomic resolution images of {110}-type GaAs surfaces are readily and reproducibly obtained.

Original languageEnglish (US)
Pages (from-to)1922-1924
Number of pages3
JournalReview of Scientific Instruments
Volume67
Issue number5
DOIs
StatePublished - Jan 1 1996

Fingerprint

Scanning tunneling microscopy
scanning tunneling microscopy
cleavage
preparation
image resolution
Ultrahigh vacuum
Image resolution
holders
ultrahigh vacuum
Diamonds
Microscopes
diamonds
microscopes
Scanning
scanning

ASJC Scopus subject areas

  • Instrumentation

Cite this

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abstract = "A novel in situ sample cleavage technique has been developed for fabricating specimens for cross-sectional scanning tunneling microscopy applications. This technique can be easily adapted to any ultrahigh vacuum scanning tunneling microscope that has coarse motion and tip exchange capabilities. A 90° bent diamond tip attached to a tip holder is used to make micron long scratches on GaAs(001) surfaces along a 〈110〉 direction. The sample is then fractured and the cross-sectional surface is scanned in the conventional way. Atomic resolution images of {110}-type GaAs surfaces are readily and reproducibly obtained.",
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Novel in situ cleavage technique for cross-sectional scanning tunneling microscopy sample preparation. / Kim, Y. C.; Nowakowski, M. J.; Seidman, David N.

In: Review of Scientific Instruments, Vol. 67, No. 5, 01.01.1996, p. 1922-1924.

Research output: Contribution to journalArticle

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