Abstract
Thin films of Tl1Ba2Ca2Cu3O9+x have been grown on single crystal (110) LaAlO3 by a metal-organic chemical vapor deposition process employing Ba(hfa)2.mep, Ca(hfa)2.tet, and Cu(dpm)2 (hfa = hexafluoroacetylacetonate; dpm = dipivaloylmethanate; tet = tetraglyme; mep = methylethylpentaglyme) as the volatile metal sources. A subsequent phase-selective annealing procedure accomplishes thallination using TlF in a bulk oxide pellet. The resulting films are nearly phase-pure and highly oriented and contain negligible fluoride by windowless energy-dispersive x-ray measurements. The films exhibit transport measured Tc = 103 K and Jc > 104 A/cm2 (77 K, 0 T) and at low temperatures retain Jc > 105 A/cm2 (5 K, 4.5 T) as measured by magnetic hysteresis.
Original language | English (US) |
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Pages (from-to) | 133-134 |
Number of pages | 2 |
Journal | Journal of Superconductivity |
Volume | 11 |
Issue number | 1 |
DOIs | |
State | Published - 1998 |
Keywords
- Fluoride
- MOCVD
- Thin films
- Tl-1223
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)