Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.
|Original language||English (US)|
|Number of pages||2|
|Journal||Proceedings - Annual Meeting, Microscopy Society of America|
|State||Published - Dec 1 1993|
|Event||Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA|
Duration: Aug 1 1993 → Aug 6 1993
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