NSLS X 1AL scanning x-ray microscope

Chris Jacobsen*, Janos Kirz, Steve Lindaas, Sue Wirick, Xiaodong Zhang, Shawn Williams, Erik Anderson, Dieter Kern, Harald Ade

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.

Original languageEnglish (US)
Pages (from-to)636-637
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - Dec 1 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

ASJC Scopus subject areas

  • Engineering(all)

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