TY - JOUR
T1 - NSLS X 1AL scanning x-ray microscope
AU - Jacobsen, Chris
AU - Kirz, Janos
AU - Lindaas, Steve
AU - Wirick, Sue
AU - Zhang, Xiaodong
AU - Williams, Shawn
AU - Anderson, Erik
AU - Kern, Dieter
AU - Ade, Harald
PY - 1993/12/1
Y1 - 1993/12/1
N2 - Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.
AB - Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.
UR - http://www.scopus.com/inward/record.url?scp=0027708968&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0027708968&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0027708968
SP - 636
EP - 637
JO - Proceedings - Annual Meeting, Microscopy Society of America
JF - Proceedings - Annual Meeting, Microscopy Society of America
SN - 0424-8201
T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America
Y2 - 1 August 1993 through 6 August 1993
ER -