NSLS X 1AL scanning x-ray microscope

Chris Jacobsen; Janos Kirz; Steve Lindaas; Sue Wirick; Xiaodong Zhang; Shawn Williams; Erik Anderson; Dieter Kern; Harald Ade

NSLS X 1AL scanning x-ray microscope

Chris Jacobsen^*, Janos Kirz, Steve Lindaas, Sue Wirick, Xiaodong Zhang, Shawn Williams, Erik Anderson, Dieter Kern, Harald Ade

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

Abstract

Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.

Original language	English (US)
Pages (from-to)	636-637
Number of pages	2
Journal	Proceedings - Annual Meeting, Microscopy Society of America
State	Published - Dec 1 1993
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

ASJC Scopus subject areas

Engineering(all)

Fingerprint Dive into the research topics of 'NSLS X 1AL scanning x-ray microscope'. Together they form a unique fingerprint.

Cite this

@article{97d12180b7d4418c9eed538909b2f035,

title = "NSLS X 1AL scanning x-ray microscope",

abstract = "Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.",

author = "Chris Jacobsen and Janos Kirz and Steve Lindaas and Sue Wirick and Xiaodong Zhang and Shawn Williams and Erik Anderson and Dieter Kern and Harald Ade",

year = "1993",

month = dec,

day = "1",

language = "English (US)",

pages = "636--637",

journal = "Proceedings - Annual Meeting, Microscopy Society of America",

issn = "0424-8201",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - JOUR

T1 - NSLS X 1AL scanning x-ray microscope

AU - Jacobsen, Chris

AU - Kirz, Janos

AU - Lindaas, Steve

AU - Wirick, Sue

AU - Zhang, Xiaodong

AU - Williams, Shawn

AU - Anderson, Erik

AU - Kern, Dieter

AU - Ade, Harald

PY - 1993/12/1

Y1 - 1993/12/1

N2 - Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.

AB - Presented in this article is the description of the NSLS X-1AL scanning x ray microscope which uses an undulator as a tunable, high brightness soft x-ray source.

UR - http://www.scopus.com/inward/record.url?scp=0027708968&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027708968&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0027708968

SP - 636

EP - 637

JO - Proceedings - Annual Meeting, Microscopy Society of America

JF - Proceedings - Annual Meeting, Microscopy Society of America

SN - 0424-8201

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -