Numerical computation of surface melting at imperfect electrical contact between rough surfaces

Wansik Kim*, Q. Jane Wang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

This paper presents a surface melting model by means of numerical simulation of three-dimensional imperfect electrical contact (ImPEC) between rough surfaces in a high electrical current application. The continuous convolution and fast Fourier transform (CC-FFT) and discrete convolution and fast Fourier transform (DC-FFT) algorithms with the conjugated gradient method (CGM) for pressure iteration are applied to solve the surface melting problem under thermo-electro-mechanically coupled ImPEC conditions. The computational result suggests that asperity melting by Joule heating of electron tunneling through a surface oxide film layer may be initiated in a very short time interval if the apparent current density is extremely high. Averaged asperity melting speeds at molten contact asperities are also predicted by means of simulated asperity melting heights.

Original languageEnglish (US)
Title of host publicationElectrical Contacts 2006
Subtitle of host publicationProceedings of the 52nd IEEE Holm Conference on Electrical Contacts
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages81-88
Number of pages8
ISBN (Print)1424405815, 9781424405817
DOIs
StatePublished - Jan 1 2006
Event52nd IEEE Holm Conference on Electrical Contacts, Holm 2006 - Montreal, QC, Canada
Duration: Jul 25 2006Jul 27 2006

Publication series

NameElectrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
ISSN (Print)0361-4395

Other

Other52nd IEEE Holm Conference on Electrical Contacts, Holm 2006
Country/TerritoryCanada
CityMontreal, QC
Period7/25/067/27/06

Keywords

  • Asperity melting heights and speeds
  • CC-FFT
  • DC-FFT
  • ImPEC
  • Surface melting

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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