Abstract
Analysis of infrared images of spatial beats between two discrete modes in a single waveguide is shown to provide a useful consistency check on the thicknesses and refractive indices of the dielectric layers.
Original language | English (US) |
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Pages (from-to) | 4920-4922 |
Number of pages | 3 |
Journal | Applied optics |
Volume | 31 |
Issue number | 24 |
DOIs |
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State | Published - Aug 20 1992 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering