Abstract
Effects arising from the intercalation of excess oxygen in Bi-O layer has been observed at room temperature using atomic force microscopy. The excess oxygen is incorporated by oxygenating the pure sample. The oxygen is trapped between the alternating Bi-O layers along the b direction. This leads to a change in the local interatomic bond length along the b axis, while the periodicity remained invariant along the a axis. In addition, in-plane atomically resolved structure of single crystal has been imaged at room temperature using AFM. The lattice spacings indicate that the observed structure corresponds to the in-plane bismuth and oxygen positions. Furthermore, high-resolution scanning tunneling spectroscopy measurements show that oxygen doping increases the Bi-O layer density of states near the Fermi level giving rise to metallicity, whereas the pure sample reveals a semiconducting energy gap in the tunneling spectrum.
Original language | English (US) |
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Pages (from-to) | 3343 |
Number of pages | 1 |
Journal | Applied Physics Letters |
Volume | 67 |
DOIs | |
State | Published - 1995 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)