Abstract
Synchrotron X-ray diffraction from a nominally amorphous molecular semiconductor film reveals both the presence of intermediate-range order (IRO) corresponding to crystalline domains with an average size of a few nanometres, and the growth of these domains upon exposure of the film to moisture.
Original language | English (US) |
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Pages (from-to) | 1458-1461 |
Number of pages | 4 |
Journal | Journal of Materials Chemistry |
Volume | 17 |
Issue number | 15 |
DOIs | |
State | Published - 2007 |
ASJC Scopus subject areas
- General Chemistry
- Materials Chemistry