Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

Daniel R. Blasini, Jonathan Rivnay, Detlef M. Smilgies*, Jason D. Slinker, Samuel Flores-Torres, Héctor D. Abruña, George G. Malliaras

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

37 Scopus citations

Abstract

Synchrotron X-ray diffraction from a nominally amorphous molecular semiconductor film reveals both the presence of intermediate-range order (IRO) corresponding to crystalline domains with an average size of a few nanometres, and the growth of these domains upon exposure of the film to moisture.

Original languageEnglish (US)
Pages (from-to)1458-1461
Number of pages4
JournalJournal of Materials Chemistry
Volume17
Issue number15
DOIs
StatePublished - 2007

ASJC Scopus subject areas

  • General Chemistry
  • Materials Chemistry

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