Keyphrases
Capacitance-conductance
50%
Capacitance-voltage
50%
Capacitance-voltage Measurements
50%
Conductance-voltage
50%
Interface Traps
50%
Inversion Layer
100%
Level Density
50%
Metal-organic Chemical Vapor Deposition (MOCVD)
100%
N-type Si
50%
Si(111)
50%
Si(111) Substrate
50%
Trap Level
50%
Voltage Measurement
50%
Material Science
Aluminum Nitride
100%
Capacitance
100%
Density
50%
Metal-Organic Chemical Vapor Deposition
100%
Engineering
Electrical Measurement
100%
Interface Trap
50%
Metal Organic Chemical Vapor Deposition
100%
Si Interface
100%
Chemistry
Conductance
50%
formation
50%
Interface Trap
50%
Metal-Organic Chemical Vapor Deposition
100%
Physics
Metalorganic Chemical Vapor Deposition
100%
Earth and Planetary Sciences
Metalorganic Chemical Vapor Deposition
100%