Observation of molecular layering in thin liquid films using X-Ray reflectivity

C. J. Yu, A. G. Richter, A. Datta, M. K. Durbin, P. Dutta

Research output: Contribution to journalArticlepeer-review

204 Scopus citations

Abstract

We report the direct observation of internal layering in thin (˜45–9Å) liquid films of nearly spherical, nonpolar molecules, tetrakis(2-ethylhexoxy)silane, using synchrotron x-ray reflectivity. The Patterson functions have secondary maxima indicating layer formation, and model-independent fitting to the reflectivity data shows that there are three electron density oscillations near the solid-liquid interface, with a period of ˜10Å (consistent with the molecular dimensions). The oscillation amplitude has a strong inverse dependence on the substrate surface roughness.

Original languageEnglish (US)
Pages (from-to)2326-2329
Number of pages4
JournalPhysical review letters
Volume82
Issue number11
DOIs
StatePublished - 1999

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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