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On the atomic resolution of a field ion microscope
Y. C. Chen
*
,
D. N. Seidman
*
Corresponding author for this work
Materials Science and Engineering
Research output
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Contribution to journal
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Article
›
peer-review
43
Scopus citations
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Keyphrases
Atomic Resolution
100%
Field Ion Microscope
100%
Tip Temperature
100%
Gas Atom
75%
Helium Gas
50%
Gas Mixture
50%
Electric Field Strength
50%
Image Size
50%
Tungsten
25%
Local Electric Field
25%
Field Dependence
25%
Equilibrium Concentration
25%
Transverse Component
25%
Gas Concentration
25%
Neon
25%
Temperature Imaging
25%
Thermal Accommodation
25%
Dependence on Tips
25%
Physics
Gas Mixture
100%
Field Strength
100%
Ion Microscopes
100%
Electric Field
100%
Chemistry
Electric Field
100%
Helium
100%
Field Ion Microscopy
50%
Purity
50%
Engineering
Gas Atom
100%
Electric Field Strength
66%
Gas Mixture
66%
Predicted Value
33%
Equilibrium Concentration
33%
Mathematics
Electric Field Strength
100%
Variance
50%
Predicted Value
50%