Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy

Junjing Deng, David J. Vine, Si Chen, Youssef Nashed, Tom Peterka, Rob Ross, Stefan Vogt, Chris Jacobsen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

X-ray fluorescence offers unparalleled sensitivity for imaging the nanoscale distribution of trace elements in micrometer thick samples, while x-ray ptychography offers an approach to image weakly fluorescing lighter elements at a resolution beyond that of the x-ray lens used. These methods can be used in combination, and in continuous scan mode for rapid data acquisition when using multiple probe mode reconstruction methods. We discuss here the opportunities and limitations of making use of additional information provided by ptychography to improve x-ray fluorescence images in two ways: by using position-error-correction algorithms to correct for scan distortions in fluorescence scans, and by considering the signal-to-noise limits on previously-demonstrated ptychographic probe deconvolution methods. This highlights the advantages of using a combined approach.

Original languageEnglish (US)
Title of host publicationX-Ray Nanoimaging
Subtitle of host publicationInstruments and Methods II
EditorsBarry Lai
PublisherSPIE
ISBN (Electronic)9781628417586
DOIs
StatePublished - 2015
EventX-Ray Nanoimaging: Instruments and Methods II - San Diego, United States
Duration: Aug 12 2015Aug 13 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9592
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherX-Ray Nanoimaging: Instruments and Methods II
CountryUnited States
CitySan Diego
Period8/12/158/13/15

Keywords

  • Deconvolution
  • Distortion correction
  • Fluorescence microscopy
  • Fly scan
  • Multiple probe modes
  • Ptychography

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Deng, J., Vine, D. J., Chen, S., Nashed, Y., Peterka, T., Ross, R., Vogt, S., & Jacobsen, C. (2015). Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy. In B. Lai (Ed.), X-Ray Nanoimaging: Instruments and Methods II [95920U] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9592). SPIE. https://doi.org/10.1117/12.2190749