Optical Characterization of Thin Films from Transmission Data using Deep Learning

Manuel Ballester*, Christoph Würsch, Emilio Marquez, Florian Willomitzer, A. K. Katsaggelos

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

We present a novel Deep Learning technique based on a CNN-LSTM architecture that directly performs the optical characterization of thin-film materials from their UV-VIS-IR transmission spectra.

Original languageEnglish (US)
DOIs
StatePublished - 2024
Event3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2024 - Part of Optica Imaging Congress - Toulouse, France
Duration: Jul 15 2024Jul 19 2024

Conference

Conference3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2024 - Part of Optica Imaging Congress
Country/TerritoryFrance
CityToulouse
Period7/15/247/19/24

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • General Computer Science
  • Space and Planetary Science
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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