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Optical constants of wurtzite ZnS thin films determined by spectroscopic ellipsometry
H. C. Ong
*
,
R. P.H. Chang
*
Corresponding author for this work
Materials Science and Engineering
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Article
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peer-review
179
Scopus citations
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INIS
zinc sulfides
100%
thin films
50%
ellipsometry
50%
range
25%
temperature range 0273-0400 k
25%
dielectrics
25%
absorption spectra
25%
binding energy
25%
refractive index
25%
dispersion relations
25%
Physics
Wurtzite
75%
Thin Films
50%
Independent Variables
50%
Room Temperature
25%
Absorption Spectra
25%
Refractivity
25%
Binding Energy
25%
Chemistry
Band Gap
50%
Binding Energy
25%
Optical Constant
25%
Dielectric Function
25%
Absorption Spectrum
25%
Refractive Index
25%
Ambient Reaction Temperature
25%
First Order
25%
Material Science
Thin Films
50%
Al2O3
25%
Dispersion
25%
Chemical Engineering
Spectroscopic Ellipsometry
50%