Optical properties of channel waveguides in BaTiO3 thin films

B. A. Block*, Bruce W Wessels, D. M. Gill, C. W. Conrad, Seng-Tiong Ho

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

BaTiO3 epitaxial films have been prepared on (001) MgO substrates by metallorganic chemical vapor deposition. The as-deposited 0.2 μm thick films had a surface roughness of 12 nm. Channel waveguides were fabricated from the films and the optical throughput measured. To differentiate the surface scattering loss from the internal scattering loss, waveguides were also prepared with a surface planarization step to reduce the surface roughness to 2.5 nm. The waveguide loss was greatly reduced for the planarized waveguides. The results indicate that surface and side wall roughness accounted for the majority of the waveguide loss. Grain boundary grooving lead to surface roughness and routes to overcome this problem are discussed.

Original languageEnglish (US)
Pages (from-to)349-354
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume446
StatePublished - Jan 1 1997

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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