Optimized conditions for imaging the effects of bonding charge density in electron microscopy

J. Ciston*, J. S. Kim, S. J. Haigh, A. I. Kirkland, Laurence Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite (Mg2SiO4). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25nm. This relatively large thickness is due to dynamical amplification of bonding contrast arising from partial de-channeling of 1s states. Simulations also suggest that bonding contrast is similarly high for an un-corrected conventional electron microscope, implying an experimental limitation of signal to noise ratio rather than spatial resolution.

Original languageEnglish (US)
Pages (from-to)901-911
Number of pages11
JournalUltramicroscopy
Volume111
Issue number7
DOIs
StatePublished - Jun 1 2011

Keywords

  • Bonding
  • Charge density
  • HREM
  • Multislice

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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