Optimized illumination for high-throughput ptychography

Yudong Yao; Junjing Deng; Jeffrey A. Klug; Yi Jiang; Michael Wojcik; Youssef Nashed; Curt Preissner; Christian Roehrig; Zhonghou Cai; Oliver Cossairt; Stefan Vogt; Barry Lai

doi:10.1117/12.2530527

Optimized illumination for high-throughput ptychography

Yudong Yao, Junjing Deng^*, Jeffrey A. Klug, Yi Jiang, Michael Wojcik, Youssef Nashed, Curt Preissner, Christian Roehrig, Zhonghou Cai, Oliver Cossairt, Stefan Vogt, Barry Lai

^*Corresponding author for this work

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

As a scanning version of coherent diffraction imaging (CDI), X-ray ptychography has become a popular and very successful method for high-resolution quantitative imaging of extended specimens. The requirements of mostly coherent illumination and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we will introduce the methods we use at the Advanced Photon Source (APS) to achieve highthroughput ptychography by optimizing the parameters of the illumination beam. One work we have done is increasing the illumination flux by using a double-multilayer monochromator (DMM) optics with about 0.8% bandwidth. Compared with our double-crystal monochromator (DCM) optics with 0.01% bandwidth, this DMM optics provides around 20 times more flux. A multi-wavelength reconstruction method has been implemented to deal with the consequential degraded temporal coherence from such an illumination to ensure high-quality reconstruction. In the other work, we adopt a novel use of at-top focusing optics to generate a at-top beam with the diameter of about 1.5 μm on the focal plane. The better uniformity of the probe and the large beam size allow one to significantly increase the step size in ptychography scans and thereby the imaging efficiency.

Original language	English (US)
Title of host publication	X-Ray Nanoimaging
Subtitle of host publication	Instruments and Methods IV
Editors	Barry Lai, Andrea Somogyi
Publisher	SPIE
ISBN (Electronic)	9781510629172
DOIs	https://doi.org/10.1117/12.2530527
State	Published - 2019
Event	X-Ray Nanoimaging: Instruments and Methods IV 2019 - San Diego, United States Duration: Aug 11 2019 → Aug 12 2019

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11112
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	X-Ray Nanoimaging: Instruments and Methods IV 2019
Country/Territory	United States
City	San Diego
Period	8/11/19 → 8/12/19

Keywords

Broad bandwidth
Coherent diffraction imaging
Flat-top zone plate
Ptychography

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2530527

Cite this

Yao, Y., Deng, J., Klug, J. A., Jiang, Y., Wojcik, M., Nashed, Y., Preissner, C., Roehrig, C., Cai, Z., Cossairt, O., Vogt, S., & Lai, B. (2019). Optimized illumination for high-throughput ptychography. In B. Lai, & A. Somogyi (Eds.), X-Ray Nanoimaging: Instruments and Methods IV Article 111120G (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11112). SPIE. https://doi.org/10.1117/12.2530527

@inproceedings{afb85de340df448bbfdbee164a56314f,

title = "Optimized illumination for high-throughput ptychography",

abstract = "As a scanning version of coherent diffraction imaging (CDI), X-ray ptychography has become a popular and very successful method for high-resolution quantitative imaging of extended specimens. The requirements of mostly coherent illumination and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we will introduce the methods we use at the Advanced Photon Source (APS) to achieve highthroughput ptychography by optimizing the parameters of the illumination beam. One work we have done is increasing the illumination flux by using a double-multilayer monochromator (DMM) optics with about 0.8% bandwidth. Compared with our double-crystal monochromator (DCM) optics with 0.01% bandwidth, this DMM optics provides around 20 times more flux. A multi-wavelength reconstruction method has been implemented to deal with the consequential degraded temporal coherence from such an illumination to ensure high-quality reconstruction. In the other work, we adopt a novel use of at-top focusing optics to generate a at-top beam with the diameter of about 1.5 μm on the focal plane. The better uniformity of the probe and the large beam size allow one to significantly increase the step size in ptychography scans and thereby the imaging efficiency.",

keywords = "Broad bandwidth, Coherent diffraction imaging, Flat-top zone plate, Ptychography",

author = "Yudong Yao and Junjing Deng and Klug, {Jeffrey A.} and Yi Jiang and Michael Wojcik and Youssef Nashed and Curt Preissner and Christian Roehrig and Zhonghou Cai and Oliver Cossairt and Stefan Vogt and Barry Lai",

note = "Funding Information: This research used resources of the Advanced Photon Source and the Center for Nanoscale Materials, U.S. Department of Energy (DOE) Office of Science User Facilities operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. This work is partially supported by the Office of the Director of National Intelligence (ODNI), Intelligence Advanced Research Projects Activity (IARPA). The views and conclusions contained herein are those of the authors and should not be interpreted as necessarily representing the official policies or endorsements, either expressed or implied, of the ODNI, IARPA, or the U.S. Government. Publisher Copyright: {\textcopyright} 2019 SPIE.; X-Ray Nanoimaging: Instruments and Methods IV 2019 ; Conference date: 11-08-2019 Through 12-08-2019",

year = "2019",

doi = "10.1117/12.2530527",

language = "English (US)",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Barry Lai and Andrea Somogyi",

booktitle = "X-Ray Nanoimaging",

}

Yao, Y, Deng, J, Klug, JA, Jiang, Y, Wojcik, M, Nashed, Y, Preissner, C, Roehrig, C, Cai, Z, Cossairt, O, Vogt, S & Lai, B 2019, Optimized illumination for high-throughput ptychography. in B Lai & A Somogyi (eds), X-Ray Nanoimaging: Instruments and Methods IV., 111120G, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11112, SPIE, X-Ray Nanoimaging: Instruments and Methods IV 2019, San Diego, United States, 8/11/19. https://doi.org/10.1117/12.2530527

Optimized illumination for high-throughput ptychography. / Yao, Yudong; Deng, Junjing; Klug, Jeffrey A. et al.
X-Ray Nanoimaging: Instruments and Methods IV. ed. / Barry Lai; Andrea Somogyi. SPIE, 2019. 111120G (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11112).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Optimized illumination for high-throughput ptychography

AU - Yao, Yudong

AU - Deng, Junjing

AU - Klug, Jeffrey A.

AU - Jiang, Yi

AU - Wojcik, Michael

AU - Nashed, Youssef

AU - Preissner, Curt

AU - Roehrig, Christian

AU - Cai, Zhonghou

AU - Cossairt, Oliver

AU - Vogt, Stefan

AU - Lai, Barry

N1 - Funding Information: This research used resources of the Advanced Photon Source and the Center for Nanoscale Materials, U.S. Department of Energy (DOE) Office of Science User Facilities operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. This work is partially supported by the Office of the Director of National Intelligence (ODNI), Intelligence Advanced Research Projects Activity (IARPA). The views and conclusions contained herein are those of the authors and should not be interpreted as necessarily representing the official policies or endorsements, either expressed or implied, of the ODNI, IARPA, or the U.S. Government. Publisher Copyright: © 2019 SPIE.

PY - 2019

Y1 - 2019

N2 - As a scanning version of coherent diffraction imaging (CDI), X-ray ptychography has become a popular and very successful method for high-resolution quantitative imaging of extended specimens. The requirements of mostly coherent illumination and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we will introduce the methods we use at the Advanced Photon Source (APS) to achieve highthroughput ptychography by optimizing the parameters of the illumination beam. One work we have done is increasing the illumination flux by using a double-multilayer monochromator (DMM) optics with about 0.8% bandwidth. Compared with our double-crystal monochromator (DCM) optics with 0.01% bandwidth, this DMM optics provides around 20 times more flux. A multi-wavelength reconstruction method has been implemented to deal with the consequential degraded temporal coherence from such an illumination to ensure high-quality reconstruction. In the other work, we adopt a novel use of at-top focusing optics to generate a at-top beam with the diameter of about 1.5 μm on the focal plane. The better uniformity of the probe and the large beam size allow one to significantly increase the step size in ptychography scans and thereby the imaging efficiency.

AB - As a scanning version of coherent diffraction imaging (CDI), X-ray ptychography has become a popular and very successful method for high-resolution quantitative imaging of extended specimens. The requirements of mostly coherent illumination and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we will introduce the methods we use at the Advanced Photon Source (APS) to achieve highthroughput ptychography by optimizing the parameters of the illumination beam. One work we have done is increasing the illumination flux by using a double-multilayer monochromator (DMM) optics with about 0.8% bandwidth. Compared with our double-crystal monochromator (DCM) optics with 0.01% bandwidth, this DMM optics provides around 20 times more flux. A multi-wavelength reconstruction method has been implemented to deal with the consequential degraded temporal coherence from such an illumination to ensure high-quality reconstruction. In the other work, we adopt a novel use of at-top focusing optics to generate a at-top beam with the diameter of about 1.5 μm on the focal plane. The better uniformity of the probe and the large beam size allow one to significantly increase the step size in ptychography scans and thereby the imaging efficiency.

KW - Broad bandwidth

KW - Coherent diffraction imaging

KW - Flat-top zone plate

KW - Ptychography

UR - http://www.scopus.com/inward/record.url?scp=85076574361&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85076574361&partnerID=8YFLogxK

U2 - 10.1117/12.2530527

DO - 10.1117/12.2530527

M3 - Conference contribution

AN - SCOPUS:85076574361

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - X-Ray Nanoimaging

A2 - Lai, Barry

A2 - Somogyi, Andrea

PB - SPIE

T2 - X-Ray Nanoimaging: Instruments and Methods IV 2019

Y2 - 11 August 2019 through 12 August 2019

ER -

Optimized illumination for high-throughput ptychography

Abstract

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Keywords

ASJC Scopus subject areas

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