Optimized illumination for high-throughput ptychography

Yudong Yao, Junjing Deng*, Jeffrey A. Klug, Yi Jiang, Michael Wojcik, Youssef Nashed, Curt Preissner, Christian Roehrig, Zhonghou Cai, Oliver Cossairt, Stefan Vogt, Barry Lai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution


As a scanning version of coherent diffraction imaging (CDI), X-ray ptychography has become a popular and very successful method for high-resolution quantitative imaging of extended specimens. The requirements of mostly coherent illumination and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we will introduce the methods we use at the Advanced Photon Source (APS) to achieve highthroughput ptychography by optimizing the parameters of the illumination beam. One work we have done is increasing the illumination flux by using a double-multilayer monochromator (DMM) optics with about 0.8% bandwidth. Compared with our double-crystal monochromator (DCM) optics with 0.01% bandwidth, this DMM optics provides around 20 times more flux. A multi-wavelength reconstruction method has been implemented to deal with the consequential degraded temporal coherence from such an illumination to ensure high-quality reconstruction. In the other work, we adopt a novel use of at-top focusing optics to generate a at-top beam with the diameter of about 1.5 μm on the focal plane. The better uniformity of the probe and the large beam size allow one to significantly increase the step size in ptychography scans and thereby the imaging efficiency.

Original languageEnglish (US)
Title of host publicationX-Ray Nanoimaging
Subtitle of host publicationInstruments and Methods IV
EditorsBarry Lai, Andrea Somogyi
ISBN (Electronic)9781510629172
StatePublished - 2019
EventX-Ray Nanoimaging: Instruments and Methods IV 2019 - San Diego, United States
Duration: Aug 11 2019Aug 12 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceX-Ray Nanoimaging: Instruments and Methods IV 2019
Country/TerritoryUnited States
CitySan Diego


  • Broad bandwidth
  • Coherent diffraction imaging
  • Flat-top zone plate
  • Ptychography

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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