Ordering of liquid squalane near a solid surface

Haiding Mo; Guennadi Evmenenko; Pulak Dutta

doi:10.1016/j.cplett.2005.08.142

Ordering of liquid squalane near a solid surface

Haiding Mo, Guennadi Evmenenko, Pulak Dutta^*

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article

26 Scopus citations

Abstract

X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO₂/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.

Original language	English (US)
Pages (from-to)	106-109
Number of pages	4
Journal	Chemical Physics Letters
Volume	415
Issue number	1-3
DOIs	https://doi.org/10.1016/j.cplett.2005.08.142
State	Published - Oct 24 2005

ASJC Scopus subject areas

Physics and Astronomy(all)
Physical and Theoretical Chemistry

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title = "Ordering of liquid squalane near a solid surface",

abstract = "X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.",

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AB - X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.

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