Abstract
X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.
Original language | English (US) |
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Pages (from-to) | 106-109 |
Number of pages | 4 |
Journal | Chemical Physics Letters |
Volume | 415 |
Issue number | 1-3 |
DOIs | |
State | Published - Oct 24 2005 |
Funding
This work was supported by the US NSF under Grant No. DMR-0305494. Use of the MRCAT was supported by the US Department of Energy, Basic Energy Sciences, Office of Science, under Contract No. W-31-109-Eng-38. We are grateful to Carlo Segre for his help with this project.
ASJC Scopus subject areas
- General Physics and Astronomy
- Physical and Theoretical Chemistry