Ordering of liquid squalane near a solid surface

Haiding Mo, Guennadi Evmenenko, Pulak Dutta*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

28 Scopus citations


X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.

Original languageEnglish (US)
Pages (from-to)106-109
Number of pages4
JournalChemical Physics Letters
Issue number1-3
StatePublished - Oct 24 2005

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry


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