TY - JOUR
T1 - Ordering of liquid squalane near a solid surface
AU - Mo, Haiding
AU - Evmenenko, Guennadi
AU - Dutta, Pulak
N1 - Funding Information:
This work was supported by the US NSF under Grant No. DMR-0305494. Use of the MRCAT was supported by the US Department of Energy, Basic Energy Sciences, Office of Science, under Contract No. W-31-109-Eng-38. We are grateful to Carlo Segre for his help with this project.
PY - 2005/10/24
Y1 - 2005/10/24
N2 - X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.
AB - X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.
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U2 - 10.1016/j.cplett.2005.08.142
DO - 10.1016/j.cplett.2005.08.142
M3 - Article
AN - SCOPUS:26444590433
VL - 415
SP - 106
EP - 109
JO - Chemical Physics Letters
JF - Chemical Physics Letters
SN - 0009-2614
IS - 1-3
ER -