Oriented thin films of YBaCu(F)O with high Tc and Jc prepared by electron beam multilayer evaporation

X. K. Wang*, K. C. Sheng, S. J. Lee, Y. H. Shen, S. N. Song, D. X. Li, R. P.H. Chang, J. B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations


Thin films of YBaCu(F)O were deposited on SrTiO3(100) substrates by multilayer deposition from three electron guns containing Y, BaF 2, and Cu under a pressure of 5×10-5 Torr of O2. The films were later annealed in a separate chamber under a flowing O2-H2O atmosphere. X-ray diffraction studies reveal that the resulting structure is highly oriented with the a axis perpendicular to the substrate. Scanning electron micrographs show a morphology consisting of an array of orthogonal, interconnecting bars with well-developed junctions. High-resolution electron microscopy and electron diffraction patterns show that these junctions are atomically abrupt and that the associated c axes are mutually perpendicular. These epitaxial films show a sharp resistive transition with Tc(R=0) as high as 90 K. The zero field critical current density, determined from magnetization measurements, is 2.9×106 A/cm2 at 4.2 K and 5.0×104 A/cm2 at 77 K.

Original languageEnglish (US)
Pages (from-to)1573-1575
Number of pages3
JournalApplied Physics Letters
Issue number16
StatePublished - 1989

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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