Oriented thin films of YBaCu(F)O with high Tc and Jc prepared by electron beam multilayer evaporation

X. K. Wang; K. C. Sheng; S. J. Lee; Y. H. Shen; S. N. Song; D. X. Li; R. P.H. Chang; J. B. Ketterson

doi:10.1063/1.101317

Oriented thin films of YBaCu(F)O with high T_c and J_c prepared by electron beam multilayer evaporation

X. K. Wang^*, K. C. Sheng, S. J. Lee, Y. H. Shen, S. N. Song, D. X. Li, R. P.H. Chang, J. B. Ketterson

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Abstract

Thin films of YBaCu(F)O were deposited on SrTiO₃(100) substrates by multilayer deposition from three electron guns containing Y, BaF ₂, and Cu under a pressure of 5×10^-5 Torr of O₂. The films were later annealed in a separate chamber under a flowing O₂-H₂O atmosphere. X-ray diffraction studies reveal that the resulting structure is highly oriented with the a axis perpendicular to the substrate. Scanning electron micrographs show a morphology consisting of an array of orthogonal, interconnecting bars with well-developed junctions. High-resolution electron microscopy and electron diffraction patterns show that these junctions are atomically abrupt and that the associated c axes are mutually perpendicular. These epitaxial films show a sharp resistive transition with T_c(R=0) as high as 90 K. The zero field critical current density, determined from magnetization measurements, is 2.9×10⁶ A/cm² at 4.2 K and 5.0×10⁴ A/cm² at 77 K.

Original language	English (US)
Pages (from-to)	1573-1575
Number of pages	3
Journal	Applied Physics Letters
Volume	54
Issue number	16
DOIs	https://doi.org/10.1063/1.101317
State	Published - 1989

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{7a846fad258343f2be5b250c6daf71d6,

title = "Oriented thin films of YBaCu(F)O with high Tc and Jc prepared by electron beam multilayer evaporation",

abstract = "Thin films of YBaCu(F)O were deposited on SrTiO3(100) substrates by multilayer deposition from three electron guns containing Y, BaF 2, and Cu under a pressure of 5×10-5 Torr of O2. The films were later annealed in a separate chamber under a flowing O2-H2O atmosphere. X-ray diffraction studies reveal that the resulting structure is highly oriented with the a axis perpendicular to the substrate. Scanning electron micrographs show a morphology consisting of an array of orthogonal, interconnecting bars with well-developed junctions. High-resolution electron microscopy and electron diffraction patterns show that these junctions are atomically abrupt and that the associated c axes are mutually perpendicular. These epitaxial films show a sharp resistive transition with Tc(R=0) as high as 90 K. The zero field critical current density, determined from magnetization measurements, is 2.9×106 A/cm2 at 4.2 K and 5.0×104 A/cm2 at 77 K.",

author = "Wang, {X. K.} and Sheng, {K. C.} and Lee, {S. J.} and Shen, {Y. H.} and Song, {S. N.} and Li, {D. X.} and Chang, {R. P.H.} and Ketterson, {J. B.}",

year = "1989",

doi = "10.1063/1.101317",

language = "English (US)",

volume = "54",

pages = "1573--1575",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "16",

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TY - JOUR

T1 - Oriented thin films of YBaCu(F)O with high Tc and Jc prepared by electron beam multilayer evaporation

AU - Wang, X. K.

AU - Sheng, K. C.

AU - Lee, S. J.

AU - Shen, Y. H.

AU - Song, S. N.

AU - Li, D. X.

AU - Chang, R. P.H.

AU - Ketterson, J. B.

PY - 1989

Y1 - 1989

N2 - Thin films of YBaCu(F)O were deposited on SrTiO3(100) substrates by multilayer deposition from three electron guns containing Y, BaF 2, and Cu under a pressure of 5×10-5 Torr of O2. The films were later annealed in a separate chamber under a flowing O2-H2O atmosphere. X-ray diffraction studies reveal that the resulting structure is highly oriented with the a axis perpendicular to the substrate. Scanning electron micrographs show a morphology consisting of an array of orthogonal, interconnecting bars with well-developed junctions. High-resolution electron microscopy and electron diffraction patterns show that these junctions are atomically abrupt and that the associated c axes are mutually perpendicular. These epitaxial films show a sharp resistive transition with Tc(R=0) as high as 90 K. The zero field critical current density, determined from magnetization measurements, is 2.9×106 A/cm2 at 4.2 K and 5.0×104 A/cm2 at 77 K.

AB - Thin films of YBaCu(F)O were deposited on SrTiO3(100) substrates by multilayer deposition from three electron guns containing Y, BaF 2, and Cu under a pressure of 5×10-5 Torr of O2. The films were later annealed in a separate chamber under a flowing O2-H2O atmosphere. X-ray diffraction studies reveal that the resulting structure is highly oriented with the a axis perpendicular to the substrate. Scanning electron micrographs show a morphology consisting of an array of orthogonal, interconnecting bars with well-developed junctions. High-resolution electron microscopy and electron diffraction patterns show that these junctions are atomically abrupt and that the associated c axes are mutually perpendicular. These epitaxial films show a sharp resistive transition with Tc(R=0) as high as 90 K. The zero field critical current density, determined from magnetization measurements, is 2.9×106 A/cm2 at 4.2 K and 5.0×104 A/cm2 at 77 K.

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U2 - 10.1063/1.101317

DO - 10.1063/1.101317

M3 - Article

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SN - 0003-6951

VL - 54

SP - 1573

EP - 1575

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

ER -

Oriented thin films of YBaCu(F)O with high T_c and J_c prepared by electron beam multilayer evaporation

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