O(3P) atom lifetimes and mobilities in xenon matrices

Herman Krueger*, Eric Weitz

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

The concentration of O atoms in xenon matrices at 32 and 40 K is followed by monitoring 736 nm emission from XeO* excimers. Emission is induced by excitation of O atom Xe pairs with 193 or 248 nm radiation. O atoms are initially produced via UV photolysis of N2O. At 32 K, approximately 50% of the atoms present after the initial probe pulse persist after eight days. The most likely mechanism for O atom decay is O+O recombination. At both temperatures, the time dependence of the concentration of O atom decay cannot be fit to a single bimolecular decay. It can, however, be fit to two (or more) bimolecular decays. Based on this mechanism, diffusion coefficients for the longer time scale diffusion process are 5.4X10-18 and 2.0X10 -17 cm2/s at 32 and 40 K, respectively. Other possible explanations for the observed O atom time dependence are discussed.

Original languageEnglish (US)
Pages (from-to)2846-2855
Number of pages10
JournalThe Journal of Chemical Physics
Volume96
Issue number4
DOIs
StatePublished - 1992

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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