Keyphrases
Microstructure
100%
Transistor
100%
Carrier Transport
100%
Ga3+
100%
Low Temperature Combustion
100%
Getter
100%
Lattice of Formations
75%
Thin-film Transistors
50%
Ionic Radius
50%
La3+
50%
Scanning Transmission Electron Microscopy
25%
X Ray Diffraction
25%
Thermal Analysis
25%
Oxides
25%
Transport Properties
25%
Metal Ions
25%
Stress Response
25%
Electron Mobility
25%
X-ray Photoelectron Spectroscopy
25%
Atomic Force Microscopy
25%
Carrier Concentration
25%
Metal Oxide
25%
Enthalpy of Formation
25%
Microstructural Analysis
25%
O Vacancy
25%
Best Predictor
25%
Composition Ranges
25%
Ioff
25%
High-angle Annular Dark-field Imaging
25%
Transistor Performance
25%
Chemical Characteristics
25%
Grazing Incidence Angle
25%
Trivalent Ions
25%
Oxide Semiconductor
25%
Sc(III)
25%
Indium Zinc Oxide
25%
Low-temperature Combustion Synthesis
25%
Positive Bias Stress
25%
Prestress
25%
Threshold Voltage Shift
25%
Oxygen Binding
25%
Optimal Composition
25%
Voltage Shift
25%
Precursor Solution
25%
Sc3+
25%
Concentration Properties
25%
Material Science
Thin-Film Transistor
100%
Carrier Transport
100%
Transistor
100%
Film
100%
Phase Composition
100%
Carrier Concentration
50%
Zinc Oxide
50%
Indium
50%
Scanning Transmission Electron Microscopy
50%
Combustion Synthesis
50%
Metal Oxide
50%
Microstructural Analysis
50%
Oxide Semiconductor
50%
Thermal Analysis
50%
X-Ray Diffraction
50%
X-Ray Photoelectron Spectroscopy
50%
Chemical Property
50%
Oxide Compound
50%
Electron Mobility
50%
Engineering
Low-Temperature
100%
Getters
100%
Ionic Radius
66%
Thin-Film Transistor
66%
Phase Composition
66%
Progression
33%
Precursor Solution
33%
Prestress
33%
Ray Diffraction
33%
Ray Photoelectron Spectroscopy
33%
Oxide Semiconductor
33%
Atomic Force Microscopy
33%
Oxygen Ion
33%
Incidence Angle
33%
Carrier Concentration
33%
Chemical Engineering
Film
100%
Enthalpy
25%
Indium
25%
Oxide Semiconductors
25%
Zinc Oxide
25%