Parametric characterization of TES detectors under DC bias

Meng P. Chiao*, Stephen James Smith, Caroline A. Kilbourne, Joseph S. Adams, Simon R. Bandler, Gabriele L. Betancourt-Martinez, James A. Chervenak, Aaron M. Datesman, Megan E. Eckart, Audrey J. Ewin, Fred Michael Finkbeiner, Enectali Figueroa-Feliciano, Richard L. Kelley, Sang Jun Lee, Maurice Leutenegger, Frederick Scott Porter, John E. Sadleir, Edward J. Wassell, Wonsik Yoon

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

The X-ray integrated field unit (X-IFU) in European Space Agency's (ESA's) Athena mission will be the first high-resolution X-ray spectrometer in space using a large-format transition-edge sensor microcalorimeter array. Motivated by optimization of detector performance for X-IFU, we have conducted an extensive campaign of parametric characterization on transition-edge sensor (TES) detectors with nominal geometries and physical properties in order to establish sensitivity trends relative to magnetic field, dc bias on detectors, operating temperature, and to improve our understanding of detector behavior relative to its fundamental properties such as thermal conductivity, heat capacity, and transition temperature. These results were used for validation of a simple linear detector model in which a small perturbation can be introduced to one or multiple parameters to estimate the error budget for X-IFU. We will show here results of our parametric characterization of TES detectors and briefly discuss the comparison with the TES model.

Original languageEnglish (US)
Article number7797450
JournalIEEE Transactions on Applied Superconductivity
Volume27
Issue number4
DOIs
StatePublished - Jun 2017

Keywords

  • Model checking
  • parametric study
  • transition-edge sensors
  • x-ray microcalorimeter

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Chiao, M. P., Smith, S. J., Kilbourne, C. A., Adams, J. S., Bandler, S. R., Betancourt-Martinez, G. L., Chervenak, J. A., Datesman, A. M., Eckart, M. E., Ewin, A. J., Finkbeiner, F. M., Figueroa-Feliciano, E., Kelley, R. L., Lee, S. J., Leutenegger, M., Porter, F. S., Sadleir, J. E., Wassell, E. J., & Yoon, W. (2017). Parametric characterization of TES detectors under DC bias. IEEE Transactions on Applied Superconductivity, 27(4), [7797450]. https://doi.org/10.1109/TASC.2016.2645164