Abstract
By defining a periodic array of square holes into a continuous ferromagnetic film an antidot array is formed. In this way the magnetisation reversal process and domain structure can be significantly changed. In these structures isolated domain states that could represent recorded bits have been observed at remanence trapped above and below antidots during hard axis magnetisation reversal. Milling holes using a focused ion beam (FIB) system is slow and reduces the integrity of the films. Here an alternative means to fabricate an antidot array by changing the magnetic properties of thin film NiFe through Ga+ implantation is outlined.
Original language | English (US) |
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Title of host publication | INTERMAG Europe 2002 - IEEE International Magnetics Conference |
Editors | J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 0780373650, 9780780373655 |
DOIs | |
State | Published - Jan 1 2002 |
Event | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002 |
Other
Other | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 |
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Country/Territory | Netherlands |
City | Amsterdam |
Period | 4/28/02 → 5/2/02 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films