Phase composition depth profiles using spatially resolved energy dispersive X-ray diffraction

Andrew C. Jupe, Stuart R Stock, Peter L. Lee, Nikhila N. Naik, Kimberly E. Kurtis, Angus P. Wilkinson*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

Spatially resolved energy dispersive X-ray diffraction, using high-energy synchrotron radiation (∼35-80 keV), was used nondestructively to obtain phase composition profiles along the radii of cylindrical cement paste samples to characterize the progress of the chemical changes associated with sulfate attack on the cement. Phase distributions were acquired to depths of ∼4 mm below the specimen surface with sufficient spatial resolution to discern features less than 200 μm thick. The experimental and data analysis methods employed to obtain quantitative composition profiles are described. The spatial resolution that could be achieved is illustrated using data obtained from copper cylinders with a thin zinc coating. The measurements demonstrate that this approach is useful for nondestructively visualizing the sometimes complex transformations that take place during sulfate attack on cement-based materials. These transformations can be spatially related to microstructure as seen by computed microtomography.

Original languageEnglish (US)
Pages (from-to)967-976
Number of pages10
JournalJournal of Applied Crystallography
Volume37
Issue number6
DOIs
StatePublished - Dec 1 2004

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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