Pitch measurements validation of a structural coloured steel insert using Scanning Confocal Microscopy (SCM) and Atomic Force Microscopy (AFM)

Dario Loaldi, Yang Zhang, Matteo Calaon, Yang Yang, Ping Guo, Jørgen Garnæs, Guido Tosello

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The optical principle of structural colouration provides to a surface unnatural and iridescent colouring properties. Surface topography combined with lighting characteristics are the physical driver of the phenomenon. Structural colouring arises from the presence on the specimen of nanoscale features distanced by a length comparable to the near visible light spectrum (300-1000 nm). The micro structures behave as a bandpass filter for certain light wavelengths, enabling an unnatural colouring effect. Elliptical Vibration Texturing (EVT) is an on development technology for fast texturing of gratings on metal inserts for structural colouration purposes. To identify the accuracy of EVT, in this study, two different microscopes assess an EVT grating with a 1000 nm nominal pitch on a steel flat surface. On first, optical-based metrology is selected adopting a Laser Scanning Confocal Microscope (SCM) with a 405 nm blue source to tackle the measuring purpose. Secondly, an Atomic Force Microscope (AFM) in Intermittent contact mode (IC-AFM) is adopted. Considering the differences in set-up time and scanning range, the objective of this research is to identify the most favourable measuring technique. On the sample images, five average profiles on different locations provide consistent information about the process repeatability. Pitch estimation comes by means of FFT algorithm on the extracted profiles. The average result for SCM measures is 1002 ± 31 nm while for AFM is 972 ± 15 nm. At last, from these results, the estimation of EVT accuracy is presented.

Original languageEnglish (US)
Title of host publicationEuropean Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018
EditorsO. Riemer, Enrico Savio, D. Billington, R. K. Leach, D. Phillips
Publishereuspen
Pages497-498
Number of pages2
ISBN (Print)9780995775121
StatePublished - 2018
Event18th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2018 - Venice, Italy
Duration: Jun 4 2018Jun 8 2018

Publication series

NameEuropean Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018

Other

Other18th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2018
CountryItaly
CityVenice
Period6/4/186/8/18

Keywords

  • Dynamic force microscopy
  • Elliptical vibration texturing
  • Scanning confocal microscopy
  • Structural colouration

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Instrumentation
  • Environmental Engineering
  • Mechanical Engineering
  • Materials Science(all)

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