Pixellated readout IC: Analysis for single photon infrared detector for fast time of arrival applications

Farah Fahim, Vala Fathipouri, Grzegorz Deptuch, Hooman Mohseni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The nano-injection sensor is a new approach towards high-sensitivity short-wave infrared photon imagers. It resolves the conflict of requiring a large area for high quantum efficiency and small area for high fidelity by using a relatively large micron-scale absorbing volume, and nano-scale sensing elements, which regulates the electron flow and amplifies the signal. The front-end electronics for the Single Photon Imaging nano-injection detector consists of an ROIC with 32 × 32 pixel array with a pixel size of 100μm × 100μm. Each pixel consists of a charge sensitive preamplifier with leakage current compensation circuit, a shaping amplifier, an AC-coupled comparator with a 7bit trimming DAC for offset cancellation, a 10-bit counter for photon counting, and a 10-bit shift register for data readout. The ROIC provides dead-time less, continuous readout with 32 parallel LVDS outputs to achieve full frame readout within 5 μs. Simulation results of the ROIC are presented in this work.

Original languageEnglish (US)
Title of host publication2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages682-685
Number of pages4
ISBN (Electronic)9781479983919
DOIs
StatePublished - Jul 27 2015
EventIEEE International Symposium on Circuits and Systems, ISCAS 2015 - Lisbon, Portugal
Duration: May 24 2015May 27 2015

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2015-July
ISSN (Print)0271-4310

Other

OtherIEEE International Symposium on Circuits and Systems, ISCAS 2015
CountryPortugal
CityLisbon
Period5/24/155/27/15

Keywords

  • dead-time less readout
  • photon counting
  • single photon detection
  • time of arrival

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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