Planar defects in patterned GaAs by aberration corrected STEM

Roberto dos Reis; Z. Liliental-Weber; C. Ophus; J. Jimenez; M. Snure; B. Gerard

doi:10.1017/S1431927612003546

Planar defects in patterned GaAs by aberration corrected STEM

Roberto dos Reis, Z. Liliental-Weber, C. Ophus, J. Jimenez, M. Snure, B. Gerard

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	338-339
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612003546
State	Published - Jul 2012

ASJC Scopus subject areas

Instrumentation

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title = "Planar defects in patterned GaAs by aberration corrected STEM",

author = "{dos Reis}, Roberto and Z. Liliental-Weber and C. Ophus and J. Jimenez and M. Snure and B. Gerard",

year = "2012",

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doi = "10.1017/S1431927612003546",

language = "English (US)",

volume = "18",

pages = "338--339",

journal = "Microscopy and Microanalysis",

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publisher = "Cambridge University Press",

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T1 - Planar defects in patterned GaAs by aberration corrected STEM

AU - dos Reis, Roberto

AU - Liliental-Weber, Z.

AU - Ophus, C.

AU - Jimenez, J.

AU - Snure, M.

AU - Gerard, B.

PY - 2012/7

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EP - 339

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

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Planar defects in patterned GaAs by aberration corrected STEM

ASJC Scopus subject areas

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