Planar defects in patterned GaAs by aberration corrected STEM

Roberto dos Reis, Z. Liliental-Weber, C. Ophus, J. Jimenez, M. Snure, B. Gerard

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)338-339
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - Jul 2012

ASJC Scopus subject areas

  • Instrumentation

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