Plasmonic nearfield scanning optical microscopy

Yuan Wang*, Werayut Srituravanich, Cheng Sun, Xiang Zhang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


Neaifield scanning optical microscopy (NSOM) offers a practical means of optical imaging at a resolution well beyond the diffraction limit of the light. However, its applications are limited due to the strong attenuation of the light transmitted through the sub-wavelength aperture. To solve this problem we report the development of plasmonic nearfield scanning optical microscope with a high optical coupling efficiency. By exciting surface plasmons, plasmonic NSOM probes are capable of focusing light into a 100 nm spot. Both numerical simulation and nearfield exposure experiments have demonstrated that the intensity at the focal point is at least 10 times stronger than can obtained from the conventional NSOM probes under the same illumination condition. By providing a strong nano-scale light source, plasmonic NSOM can be used as a high speed nano-scale imaging tool for cellular visualization, molecule detection, and many other applications requiring high temporal resolution.

Original languageEnglish (US)
Title of host publicationPlasmonics
Subtitle of host publicationNanoimaging, Nanofabrication, and their Applications II
StatePublished - 2006
EventPlasmonics: Nanoimaging, Nanofabrication, and their Applications II - San Diego, CA, United States
Duration: Aug 16 2006Aug 17 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherPlasmonics: Nanoimaging, Nanofabrication, and their Applications II
Country/TerritoryUnited States
CitySan Diego, CA


  • Nearfield scanning optical microscopy
  • Plasmonic lens
  • Surface plasmon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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