Abstract
We show, with use of a field-emission scanning transmission electron microscope, changes in the plasmon region from thin films of silicon in a cobalt matrix. These effects are consistent with the dielectric-response theory developed by Howie.
Original language | English (US) |
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Pages (from-to) | 9182-9184 |
Number of pages | 3 |
Journal | Physical Review B |
Volume | 42 |
Issue number | 14 |
DOIs | |
State | Published - 1990 |
ASJC Scopus subject areas
- Condensed Matter Physics