Polarity Inversion in Polar-Nonpolar-Polar Heterostructures

Sunglae Cho, Suk J. Youn, Yunki Kim, Antonio DiVenere, George K.L. Wong, Authur J. Freeman, J. B. Ketterson

Research output: Contribution to journalArticlepeer-review


We have observed an epilayer-thickness-dependent polarity inversion for the growth of CdTe on Sb(Bi)/CdTe(111)B. For films with Sb(Bi) thicknesses of less than 40Å (15Å), the CdTe layer shows a B (Te-terminated) face, but it switches to an A (Cd-terminated) face for thicker layers. On the other hand, a CdTe layer grown on Bi(Sb)/CdTe(111)A always shows the A face regardless of Sb or Bi layer thicknesses. In order to address the observations we have performed ab initio calculations, which suggest that the polarity of a polar material on a nonpolar one results from the binding energy difference between the two possible surface configurations.

Original languageEnglish (US)
Pages (from-to)126403-126403-4
JournalPhysical review letters
Issue number12
StatePublished - Sep 17 2001

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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