Polarity inversion of CdTe(111) orientation grown on Bi (00.1) by molecular beam epitaxy

A. Divenere, X. J. Yi, C. L. Hou, H. C. Wang, J. B. Ketterson, G. K. Wong, I. K. Sou

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Using in situ reflection high-energy electron diffraction analysis and chemical etching it is shown that CdTe grown on Bi layers deposited on CdTe (1̄1̄1̄)B terminated surfaces result in (111)A terminated surfaces. The Bi layers exhibit streaked diffraction patterns with clear Kikuchi lines; this is the first direct evidence for the layer by layer two-dimensional growth of Bi on CdTe by molecular beam epitaxy.

Original languageEnglish (US)
Pages (from-to)2640-2642
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number21
DOIs
StatePublished - 1993

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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