Polytypoid structures in annealed In2O3-ZnO films

Y. Yan*, S. J. Pennycook, J. Dai, R. P.H. Chang, A. Wang, T. J. Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

70 Scopus citations


Atomic-resolution Z-contrast images demonstrate unambiguously that the annealed, metalorganic chemical vapor deposition derived transparent In2O3-ZnO films have a polytypoid microstructure, consisting of ZnO slabs of variable width separated by single In-O octahedral layers. These In-O layers induce a polarity inversion in the two adjacent ZnO layers, which is reversed again by a mirror domain boundary inside each ZnO slab.

Original languageEnglish (US)
Pages (from-to)2585-2587
Number of pages3
JournalApplied Physics Letters
Issue number18
StatePublished - 1998

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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