Posterior distribution charts: A Bayesian approach for graphically exploring a process mean

Daniel W. Apley*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Fingerprint Dive into the research topics of 'Posterior distribution charts: A Bayesian approach for graphically exploring a process mean'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science