Practical error estimation in zoom-in and truncated tomography reconstructions

Xianghui Xiao*, Francesco De Carlo, Stuart Stock

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Synchrotron-based microtomography provides high resolution, but the resolution in large samples is often limited by the detector field of view and the pixel size. For some samples, only a small region of interest is relevant and local tomography is a powerful approach for retaining high resolution. Two methods are truncated tomography and zoom-in tomography. In this article we use existing theoretical results to estimate the error present in truncated and zoom-in tomographic reconstructions. These errors agree with the errors calculated from exact tomographic reconstructions. We argue in a heuristic manner why zoom-in tomography is superior to the truncated tomography in terms of the reconstruction error. However, the theoretical formula is not usable in practice because it requires the complete high-resolution reconstruction to be known. To solve this problem we proposed a practical method for estimating the error in zoom-in and truncated tomographies. The results using this estimation method are in very good agreement with our experimental results.

Original languageEnglish (US)
Article number063705
JournalReview of Scientific Instruments
Volume78
Issue number6
DOIs
StatePublished - 2007

ASJC Scopus subject areas

  • Instrumentation

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